Abstract
Nuclear muscopy uses focused MeV ion mubeams to non-destructively characterize materials and components with mun scale spatial resolution. Although a number of accelerator-based mubeam methods are available for materials analysis, this paper centers on the techniques of Ion mutomography (IMT) and Particle-Induced X-ray Emission (PIXE). IMT provides quantitative three-dimensional density information with mun-scale spatial resolution and 1% density variation sensitivity. Recently, IMT has become more versatile because greater emphasis has been placed on understanding the effects of reconstruction artifacts, beam spatial broadening, and limited projection data sets. PIXE provides quantitative elemental information with detection sensitivities to 1 μg/g or below in some instances. By scanning the beam, two-dimensional maps of elemental concentration can also be recorded. However, since X-rays are produced along the entire path of the ion beam as it penetrates the sample, these measurements only give depth-averaged information in general. PIXE tomography (PIXET) is the natural extension from conventional PIXE analysis to the full three-dimensional measurement and forms the bridge linking the complementary techniques of PIXE and IMT. This paper presents recent developments and applications of these ion beam techniques in a diverse range of fields including characterizing metal-matrix composites, biological specimens and inertial confinement fusion targets.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.