Abstract
The electron and hole drift-mobilities of tris(8-hydroxy-quinolinato) aluminium (Alq3) thin films have been determined using impedance spectroscopy (IS) measurements. The theoretical basis of drift-mobility measurement with IS rests on a theory for single-injection space-charge limited current. The electron drift-mobilities in Alq3 which measured from the frequency dependence of both capacitance and conductance had the same electric-field dependence and were identical to those measured by a time-of-flight (TOF) transient photocurrent technique. To estimate the hole drift-mobility in Alq3, a 4,4′-bis[N-(1-naphthyl)-N-phenyl-amino]-biphenyl thin film was inserted as an injection layer to reduce the hole injection barrier between an injection electrode and the Alq3 thin film. The hole drift-mobilities of Alq3 thin films measured with IS were identical to those measured by the TOF method. These results are essential for clarifying the mechanism of the carrier transport of organic light emitting diodes (OLEDs) with the aim of improving OLED performance.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Similar Papers
More From: Thin Solid Films
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.