Abstract
Complex Products may present more than one type of defects and these defects are not always of equal severity. These defects are classified according to their seriousness and effect on product quality and performance. Demerit systems are very effective systems to monitoring the different types of defects. So, classical demerit control chart used to monitor counts of several different types of defects simultaneously in complex products. Recently, H.W. Kang et al.[7] introduced Demerit-GWMA(generally weighted moving average) and Demerit-EWMA control charts that can detect small shifts of the process mean more sensitively than the classical demerit control charts. In this paper, we present an effective method for process control using the Demerit-GWMA statistics with fast initial response. Moreover, we evaluate exact performance of the Demerit-GWMA control chart with fast initial response(FIR), Demerit-GWMA and Demerit-EWMA according to changing sample size or parameters.
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