Abstract
By examples of multilayered film structure Cu/[FeNi/Cu]10 deposited by the method of ion-plasma sputtering, a comparative analysis of the magnetic hysteresis loops measured on a vibrating magnetometer, a magnetic measuring complex with primary converter on the basis of SQUID (SQUID magnetometer), and a magneto-optical Kerr microscope is carried out. The use of a SQUID magnetometer made it possible to detect the step-by-step nature of remagnetization of the film structure, the presence of which was confirmed by observations on the Kerr microscope in the quasi-static remagnetization mode.
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