Abstract
The “multilayer silicene” films were grown on Ag(111), with increasing thickness above 30 monolayers (ML). Scanning tunneling microscopy (STM) observations suggest that the “multilayer silicene” is indeed a bulk-like Si(111) film with a (√3 × √3)R30° honeycomb superstructure on surface. The possibility for formation of Si(111)(√3 × √3)R30°-Ag reconstruction on the surface can be distinctively ruled out by peeling off the surface layer with the STM tip. On this surface, delocalized surface state as well as linear energy-momentum dispersion was observed from quasiparticle interference patterns. Our results indicate that a bulklike silicon film with diamondlike structure can also host delocalized surface state, which is even more attractive for potential applications, such as new generation of nanodevices based on Si.
Highlights
Interestingly, quasiparticle interferences (QPI) patterns were observed for all films with different thicknesses, and linear energy-momentum dispersion has been deduced
A monolayer silicene film grown on Ag(111) surface exhibits a variety of different structural phases such as 4 × 43,22–25, √13 × √133,4, √7 × √73,25, 2√3 × 2√324,25 (with respect to Ag(111) surface lattice) and √3 × √33,6
This can be explained by the fact that the local density of states (LDOS) is different on the √3 layer surface and the Ag(111)
Summary
Interestingly, quasiparticle interferences (QPI) patterns were observed for all films with different thicknesses, and linear energy-momentum dispersion has been deduced. Such (√3 × √3)R30° reconstruction, and delocalized surface state have never been observed on surface of bulk silicon in the intensive study in the last several decades. The bulk-like Si film with delocalized surface state is fascinating for potential nano device applications as compared with monolayer silicene, since it is easier to obtain, substrate effects are avoided, and directly compatible with the silicon microelectronic industry
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