Delay defect diagnosis based upon a statistical timing model – the first step

Abstract

The problem of diagnosing delay defects is defined using a statistical timing model. The differences between delay defect diagnosis and traditional logic defect diagnosis are illustrated. Different diagnosis algorithms are proposed and their performance evaluated via statistical defect injection and statistical delay fault simulation. With a statistical timing analysis framework developed in the past, new concepts in delay defect diagnosis are demonstrated and experimental results are discussed based upon benchmark circuits.