Abstract
A statistical experimental investigation of the characteristic changes associated with the degree-of-polarization reduction of high-power laser diodes is reported. A simple model accounting for the stress-induced degree-of-polarization changes through the photoelastic effect is introduced to qualitatively support the experimental results. Functional characteristics addressed in the investigation are the threshold current, the slope efficiency, the polarization-resolved far field and near field, and the beam parameter product. Model outcomes and measured parameters related to different degree-of-polarization values have proven very useful for device optimization aimed to polarization multiplexing applications.
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