Abstract
AbstractDynamic and static properties of the contact resistance of twisted conductor splices have been investigated. The splice resistance in a static condition increases (degraded) with time. This is described in terms of a probability density function in which the logarithm of the splice resistance is regarded as a Markovian process. Furthermore, properties of the splice resistance when different mechanical qualities are involved in it are described by a composite probability density function. The theoretical prediction agrees well with observation. The dynamic properties are attributed to temporal change in the displacement of the conductors and in the contact force of the core conductors which is caused by an external force applied on them. Their dependence is given explicitly and a formula for evaluating the aging effect has been derived. Finally, the validity of this model is confirmed by the experimental results.
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