Degradation monitoring of multilayer ceramic capacitors during high accelerated lifetime testing using ultrasound

Abstract

Multilayer ceramic capacitors (MLCCs) are vital circuitry components where long-term stability at high temperature and fields is critical to device operation. High accelerated lifetime testing (HALT) statistically investigates reliability and lifetime of MLCCs through exposure to temperatures and voltages exceeding normal operating conditions. The long-term reliability of the dielectric layers in MLCCs strongly depends on potential variability in the dielectric microstructure, such as cracking, which can be challenging to detect. Nondestructive ultrasonic evaluation is sensitive to microstructural changes through measurements of wave scattering. This work uses high frequency (100 MHz) focused ultrasonic scattering methods to nondestructively monitor structural and microstructural changes in MLCCs from the pristine to the failed state during HALT to understand structural origins of electrical failure. Printed circuit board mounted MLCCs were electrically and ultrasonically characterized in a pristine state and during various degraded states before and after electrical failure under HALT. Evidence of damage pre-HALT was ultrasonically indicated by high attenuation regions on the ultrasonic maps suggesting that the mounting process may induce damage. The high attenuation regions in the pristine samples evolved throughout HALT indicating that the damage in the pristine state might be the spatial origin of part failure, which underscores the impact and importance of detection of structural defects on the reliability of MLCCs.