Abstract
ABSTRACT The defect-related relaxation behaviors and the leakage of fresh and/or dc-electrically degraded specimens of Au/(Ba0.5Sr0.5)TiO3/Pt capacitors on the TiO2 coated sapphire substrates were investigated. The relaxation behaviors of (Ba0.5Sr0.5)TiO3 films are assumed to be the electron-detrapping in the depletion layer. The local electric field enhancement due to oxygen vacancies near the Pt/(Ba0.5Sr0.5)TiO3 interface, which is estimated from the Poisson equation, was assumed to be sufficiently high as a cause of tunneling conduction, and assumed to be a cause of dc-electrical degradation.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
