Abstract
A new device that has been developed for optical signal processing applications is the VLSI/ferroelectric liquid crystal spatial light modulator (SLM). These SLM's are attractive for optical processing applications because of their size, speed, and resolution. They can also be used for either binary phase or intensity modulation. However, these SLM's operate in reflection mode where surface variations and other device defects are enhanced. The types of defects that affect phase and intensity modulation are pixel-to-pixel height variations, surface curvature, nonuniform liquid crystal alignment, and zonal effects caused by ion migration. These defects are examined specifically for optical-correlator applications since the correlation process is senstive to both phase and amplitude. Optical correlators can also use either binary phase or intensity modulation at the image plane. This allows direct comparison for device defects on optical correlator performance for intensity vs. phase modulation. Theoretical and experimental analyses are presented.
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