Abstract
Crystalline interfaces are of two basic types - interfaces in single phase solids separating grains of differing orientation (grain boundaries, sub-grain boundaries, twin boundaries), and interphase interfaces separating crystals which differ in crystal structure and/or composition, as well as relative orientation. Depending upon these variables a particular boundary will have more or less interfacial structure which can be resolved by transmission electron microscopy. The dislocations (line defects) which are imaged at boundaries by electron diffraction contrast effects may be unique to the boundary, i.e., have displacement vectors which are different from those of dislocations found in single phase materials. Analysis may be further complicated by extra diffraction effects such as superimposed Moire patterns (Fig. 1a and 2).
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
