Abstract

We have studied the luminescence of extended defects of single-crystalline and polycrystalline ZnSe using two-photon confocal microscopy in the spectral range 450–720 nm; we have also investigated the influence of Cr and Fe doping on the defect structure of ZnSe. Maps of luminescence were obtained with micro-scale spatial resolution from the depth reaching 3 mm under the surface.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call