Abstract
We have studied the luminescence of extended defects of single-crystalline and polycrystalline ZnSe using two-photon confocal microscopy in the spectral range 450–720 nm; we have also investigated the influence of Cr and Fe doping on the defect structure of ZnSe. Maps of luminescence were obtained with micro-scale spatial resolution from the depth reaching 3 mm under the surface.
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