Abstract
Metal (Fe and Ni) samples ion-irradiated at 100 – 773 K were characterized by Doppler broadening measurements with slow positron beams to investigate depth profiles of irradiation-induced defects. Obtained results were compared with defect profiles calculated by Monte-Carlo simulation. Defects profiles obtained by positron measurements were always deeper than those by the simulation. The difference between measured and simulated profiles was observed even in the case of the Fe sample irradiated at 100 K where vacancies are immobile. The origin of such differences was discussed with respect to vacancy diffusion, depth calculation, surface contamination and ion channeling.
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