Abstract
A method of characterizing defects on an unrecorded optical disk is described. Information on the density of defects is obtained by analyzing the statistical distribution of the widths of the pulses obtained when playing back an unrecorded disk. It was shown that disk quality, as measured by bit error rates on actual recording, can be correlated with defect densities measured in this manner. The same method can also be used to characterize defects on uncoated substrates. It was demonstrated that defects on tellurium coated disks are largely the result of defects on the uncoated substrates.
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