Abstract
The incorporation of rare-earth elements into BaTiO3-based multilayer ceramic capacitors (MLCCs) plays a pivotal role in enhancing the dielectric constant and reliability. In this study, The BaTiO3-based ceramics doped with La and Dy were prepared separately and their dielectric properties and reliability were thoroughly compared. The La-doped sample exhibited a significantly enhanced dielectric constant, which can be attributed to the short-range migration of liberated oxygen vacancies () facilitated by the incorporation of defects -. However, the presence of free in the La-doped sample led to a significant reduction in insulation resistivity during the initial application of the electric field. Microstructural analysis of the failure points resulted in the proposal of an electrical breakdown model, which elucidates the superior breakdown strength observed in the La-doped sample. This study provides novel insights for the development of MLCCs with high dielectric constants and high reliability.
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