Abstract

We present one method for detecting defects on an inclined textured plane. This method uses a combination of a shape from texture (SFT) method with the Delaunay triangulation technique. The SFT method provides the theoretical equation of the plane orientation in two steps. First, a wavelet decomposition allows us to build an image of the inverse of the local frequency, that is the scale, that we call the local scales map. Then we perform an interpolation of this map using the equation of the theoretical variation of the scales. With the interpolation parameters it is possible to extract the texels by the use of an adaptive thresholding for each pixel of this map. Then we compute the centers of each texel in order to match a mesh on it after processing a Delaunay triangulation. When there is a defect, the regularity of the triangulation is disturbed, so one hole appears in the mesh.

Highlights

  • It is not easy to detect defects on an inclined plane because the relations between the different points are modified according to the orientation of the plane

  • We present one way to detect defects on an inclined plane which is covered by a regular macrotexture

  • We compute the local scale of each pixel of the image by a wavelet decomposition

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Summary

INTRODUCTION

It is not easy to detect defects on an inclined plane because the relations between the different points are modified according to the orientation of the plane. We have to find a method which takes the variations tied to the orientation into account, so we use a shape from texture (SFT) method followed by a Delaunay triangulation in order to perform defect detection. This technique allows us to find defects on regular macroscopic texture (Figure 1). Before looking for defects, it is necessary to obtain the theoretical equation of the inclined textured plane This equation gives us a threshold value for extracting the texels. We present the performance of our method on different kinds of defects

EQUATIONS OF THE INCLINED PLANE
MESH COMPUTATION
DEFECTS EXTRACTION AND RESULTS
CONCLUSION

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