Abstract
A new technique has been developed for deconvolving diode-laser spectra. This technique treats Doppler broadening, collisional broadening, and instrumental effects simultaneously. This technique is superior to previous deconvolution methods in the recovery of line-strength and transition-frequency information. A section of the ethane spectrum near 12 microns is used as an example. This new approach applies to any spectroscopy in which the instrumental resolution is narrower than actual linewidths.
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