Abstract
Fringes in an FT-IR spectrum, resulting e.g. from internal reflection within a sample window, may seriously hinder spectral analysis. A Fourier filtering procedure is presented as an alternative to interferogram editing or partially least squares procedures for the removal of fringes in an FT-IR spectrum. This method is especially useful when the interferogram is not available anymore and the number of absorption bands, present in the spectrum is not exactly known beforehand. The scope and limitations of the method is discussed as well as the choice of the deconvolution parameters.
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