Decoding the magnetic bit positioning error in a ferrimagnetic racetrack.

Abstract

Current-driven motion of magnetic domain walls is one of the key technologies for developing storage class memory devices. Extensive studies have revealed a variety of material systems that exhibit high-speed and/or lower power propagation of the domain walls driven by electric current. However, few studies have assessed the reliability of the operations of the memory technology. Here, we decode the errors associated with writing and shifting domain walls using nanosecond current pulses in a ~5-micrometer-wide wire composed of a Pt/GdFeCo bilayer. We find that writing a domain wall at the edge of the wire causes a bit positioning error of ~0.3 micrometers, whereas the shifting process induces an error of ~0.1 micrometers per a 2-nanosecond-long current pulse. The error correlation among successive shifting is negligible when the current drive is sufficiently large. These features allow reliable operation of highly packed domain walls in a ferrimagnetic racetrack.