Decay of the excited compound system Ni*56 formed through various channels using deformed Coulomb and deformed nuclear proximity potentials

Abstract

The total cross section, the intermediate mass fragment (IMF) production cross section, and the cross section for the formation of light particles (LPs) for the decay of compound system $^{56}\mathrm{Ni}^{*}$ formed through the entrance channel $^{32}\mathrm{S}+^{24}\mathrm{Mg}$ have been evaluated by taking the scattering potential as the sum of deformed Coulomb and deformed nuclear proximity potentials, for various ${E}_{\mathrm{c}.\mathrm{m}.}$ values. The computed results have been compared with the available experimental data of total cross section corresponding to ${E}_{\mathrm{c}.\mathrm{m}.}=60.5$ and 51.6 MeV for the entrance channel $^{32}\mathrm{S}+^{24}\mathrm{Mg}$, which were found to be in good agreement. The experimental values for the LP production cross section and IMF cross section for the channel $^{32}\mathrm{S}+^{24}\mathrm{Mg}$ were also found to agree with our calculations. Hence we have extended our studies and have thus computed the total cross section, IMF cross section, and LP cross section for the decay of $^{56}\mathrm{Ni}^{*}$ formed through the other three entrance channels $^{36}\mathrm{Ar}+^{20}\mathrm{Ne},^{40}\mathrm{Ca}+^{16}\mathrm{O}$, and $^{28}\mathrm{Si}+^{28}\mathrm{Si}$ with different ${E}_{\mathrm{c}.\mathrm{m}.}$ values. Hence, we hope that our predictions on the evaluations of the IMF cross sections and the LP cross sections for the decay of $^{56}\mathrm{Ni}^{*}$ formed through these three channels can be used for further experimental studies.