Abstract
The synthetic porous SiO 2 polymorph decasil crystallizes in the monoclinic space group C2/m. Its structure is characterized by interconnected rods of small cages built up from SiO 4 tetrahedra. These rods are aligned parallel to the c axis. Decasil often displays structural disorder producing diffuse X-ray diffraction effects, which consist of streaks between Bragg reflections. These streaks are constrained to layers of the reciprocal lattice perpendicular to the c axis. Combining knowledge of the crystal structure and the observation of diffuse diffraction, a model of disorder and a method to calculate the diffuse diffraction intensity are developed. The model of disorder involving differently oriented rods allows the application of a recursive method of intensity calculation, previously developed for stacking faults.
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