De-embedding technique relying on a new formalism for two-port network characterization using raw S-parameter measurements

Abstract

A de-embedding technique based on a new formalism is proposed for determining all scattering (S-) parameters of a two-port network (or sensing area) using raw (uncalibrated) measurements at microwave frequencies. It uses raw S-parameter measurements of a reflecting line, (direct and reversed configurations) a non-reflecting line, and (direct and reversed configurations) a device (e.g., only three different topologies). In addition to its unique advantage that it fully and uniquely determines S-parameters of a two-port network, it also has the capability of determining terms of error networks, as a byproduct, up to two multiplicative constant terms. The formalism was tested for evaluating S-parameters of a sensing area of a microstrip line sensor, as a two-port device, involving double SRRs next to a microstrip line. Root-mean-square-error analysis was implemented to examine the accuracy of our extracted S-parameters in comparison with those of similar de-embedding techniques in the literature.