Abstract
Precision measurements of the electrical resistivity ρ(T) of a cadmium single crystal normal to the c-axis in the temperature range 1-9K are presented.The sample thickness d was reduced by chemical polishing from 1 to 0.04mm and the data were obtained for samples with mat and mirror-like surfaces. For all thicknesses etching a polished surface increases the residual resistivity ρ0 and decreases the temperature dependence of ρ. There is a minimum in ρ-ρ0 when d∼mean free path. A T2- variation of the surface resistivity is observed over a limited temperature range. These features are in qualitative agreement with the size effect theories including an angle dependent specularity parameter; the minimum is deeper and the T2- range more extended than predicted by the free electron model.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
