Abstract
Room temperature direct current (DC) photocurrents were measured for detector grade Cd1−xZnxTe (CZT) crystals in the spectral range of 400–1000 nm as a function of light intensity and voltage. The photocurrent data were analyzed and fit to a theoretical model to extract the electrical transport properties for high-resistivity detector grade CZT material. Using the DC photocurrent measurements, the mobility-lifetime () products and the surface recombination velocities for both electrons and holes were measured. For this study the CZT detectors had Au contacts, and the surfaces were treated in a standard 5% bromine in methanol etching solution. The correlation of the DC photocurrent measurements and detector performance is also reported.
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