Abstract

Over the years, there has been a consistent increase in the amount of data collected by systems and processes in many different industries and fields. Simultaneously, there is a growing push towards revealing and exploiting of the information contained therein. The chemical processes industry is one such field, with high volume and high-dimensional time series data. In this paper, we present a unified overview of the application of recently-developed data visualization concepts to fault detection in the chemical industry. We consider three common types of processes and compare visualization-based fault detection performance to methods used currently.

Highlights

  • The advent of data historian systems has turned the chemical industry into a prime generator and depository of large-scale datasets, typically in a time series format

  • We provide an overview of recently-developed visualization techniques for process data

  • The concept underpinning these techniques is a time-explicit Kiviat diagram, which allows for plotting multivariate time series data collected during the operation of chemical processes

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Summary

Introduction

The advent of data historian systems has turned the chemical industry into a prime generator and depository of large-scale datasets, typically in a time series format. Data historians collect and store measurements from potentially hundreds or thousands of sensors and actuators, often with sub-minute frequency. In many cases, these “big data” sets cover several years or even decades, and their sheer volume is often mentioned as a major obstacle towards extracting the valuable and actionable information contained therein. Process operators frequently find themselves “drowning in data” [1], citing, amongst others, the lack of time and human resources required to analyze (“mine”) these data, as well as the lack of appropriate tools, as a significant impediment. In the context of this paper, we will focus on the latter and refer the reader to the thorough review by Venkatasubramanian et al [2] for more information on model-based methods

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