Data-driven extraction and analysis of repairable fault trees from time series data

Abstract

Fault tree analysis is a probability-based technique for estimating the risk of an undesired top event, typically a system failure. Traditionally, building a fault tree requires involvement of knowledgeable experts from different fields, relevant for the system under study. Nowadays’ systems, however, integrate numerous Internet of Things (IoT) devices and are able to generate large amounts of data that can be utilized to extract fault trees that reflect the true fault-related behavior of the corresponding systems. This is especially relevant as systems typically change their behaviors during their lifetimes, rendering initial fault trees obsolete. For this reason, we are interested in extracting fault trees from data that is generated from systems during their lifetimes. We present DDFTAnb algorithm for learning fault trees of systems using time series data from observed faults, enhanced with Naïve Bayes classifiers for estimating the future fault-related behavior of the system for unobserved combinations of basic events, where the state of the top event is unknown. Our proposed algorithm extracts repairable fault trees from multinomial time series data, classifies the top event for the unseen combinations of basic events, and then uses proxel-based simulation to estimate the system’s reliability. We, furthermore, assess the sensitivity of our algorithm to different percentages of data availabilities. Results indicate DDFTAnb’s high performance for low levels of data availability, however, when there are sufficient or high amounts of data, there is no need for classifying the top event.