Abstract
A data analysis technique for microwave imaging reflectometry (MIR) in the Large Helical Devices (LHD) and TPE-RX plasmas has been investigated. In LHD, the fast Fourier transform (FFT) is employed. The statistical properties of the fluctuation spectra on MIR signals are quantified by the time-frequency analysis by the ensemble average technique. Statistical analyses using cross-correlation and coherence spectra reveal the characteristics of MHD modes, such as wave numbers, mode numbers, and phase velocity. In TPE-RX, the wavelet analysis is more useful because the phenomena are transient in TPE-RX plasma.
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