Abstract
An efficient run-time application mapping approach can considerably enhance resource utilization and mitigate the dark silicon phenomenon. In this chapter, we present a dark silicon aware run-time application mapping approach that patterns active cores alongside the inactive cores in order to evenly distribute power density across the chip. This approach leverages dark silicon to balance the temperature of active cores to provide higher power budget and better resource utilization, within a safe peak operating temperature. In contrast to exhaustive search based mapping techniques, the proposed agile heuristic approach has a negligible run-time overhead. This patterning strategy yields a surplus power budget of up to 17 % along with an improved throughput of up to 21 % in comparison with other state-of-the-art run-time mapping strategies, while the surplus budget is as high as 40 % compared to worst case scenarios.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.