Abstract
We evaluated the ablation threshold of silicon and synthetic fused silica, which are widely used as optical substrates such as those in X-ray mirrors. A focusing XFEL beam with a beam size of approximately 1 μm at a photon energy of 10 keV was used. We confirmed that the ablation thresholds of these materials, which were 0.8 μJ/μm2 for the silicon and 4 μJ/μm2 for the synthetic fused silica, approximately agreed with the melting dose.
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