Abstract
Polyaniline has been the oldest among all the conducting polymers. The unique properties of conducting polymers not only provide great scope for their applications but also have led to the development of new models to explain their observed properties. Polyaniline has rapidly become the subject of considerable interest for physicists, chemists and material scientists. In this paper we have carried out the Scanning Electron Microscopy characteristics of Polyaniline thin films doped with different concentrations (15% & 30%) of the dopants like Potassium Bromide and Picric Acid. The films has been prepared by using Vacuum Evaporation Technique and then characterized for SEM studies by using Scanning Electron Microscopy unit. The SEM study reveals that the grain size increases with the increase in the concentration of the above said dopants which in turn increases the crystallinity of the material. This behavior ensures its application in the optoelectronic devices.
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