Abstract
AbstractChromiumoxide (Cr2O3) thin films were controllably synthesized by pulsed‐spray evaporation chemical vapor deposition (PSE‐CVD) for deep oxidation of propene. The effect of substrate temperature on the growth kinetics and morphology of the films was investigated. The prepared samples were comprehensively characterized with respect to structure, morphology and surface composition with XRD, SEM and XPS, respectively. An in situ diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS) was involved to reveal the surface mechanism occurred on Cr2O3. The growth rate exhibited a linear behavior when the temperature increase from 300 to 450 °C. The structural analysis indicated that a pure phase of Cr2O3 was obtained at 425 °C. The catalytic tests showed that Cr2O3 films prepared on flexible substrates exhibited advantages for the catalytic oxidation of C3H6. Based on the DRIFTS observations, the Langmuir‐Hinshelwood (L‐H) mechanism was proposed for C3H6 over Cr2O3 films. (© 2015 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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