CVD Grown Nanodimensional Semiconductor Heterostructure: Structural and Optical Properties

Abstract

The CdSe/CdS heterostructure nanolayer thin films grown by chemical vapour deposition (CVD) technique are discussed. The morphological characterization of heterostructure is examined using scanning electron microscopy (SEM) micrographs which demonstrate the polycrystalline structure is well-developed. The structural characterization of the heterostructure using X-ray diffraction (XRD) studies reveals that the sample’s structure is hexagonal. The optical characterization has been performed using a UV-Visible spectrophotometer that might illustrate the formation of the CdSe/CdS heterostructure interface. These studies could help to design new optoelectronic devices with a high level of efficiency.