Abstract
For Gaussian surfaces, profile spectral moments can be used to parameterize a model describing the stochastic geometry of a surface. Instead of using straight profiles, the use of curved profiles is presented as an alternative method for measuring profile spectral moments in different directions. By obtaining curved profiles from a spiral profile, a surface can be sampled faster than is possible by taking five straight profiles and profiles in more directions are obtained so a least squares procedure can be used to estimate the surface spectral moments. An error analysis and experimental tests show that with the proper choice of sampling parameters, curved profiles can be used instead of straight profiles for estimating profile spectral moments.
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