Abstract
A buffered direct-injection (BDI) current readout for infrared detectors is described and analyzed. It is compared with the common direct-injection (DI) circuit with respect to injection efficiency, noise, and tolerance of low RoA product photovoltaic detectors. Power requirements and threshold control are also discussed. Throughout the analysis it is clear that much advantage is gained at relatively little cost by the use of a BDI structure for an integrated circuit focal plane.
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