Abstract
In this paper a sensitive measuring circuit is described for the measurement of current noise on high quality thin and thick film resistors. Measured data on resistors are presented and analysed.
Highlights
Thin and thick film resistors show a very low curren.t noise level (10 nV/V per decade), which makes current noise hard to measure
This means that, besides the sensitivity problems of the industrial equipment, the used frequency range from 618 Hz to 1618 Hz is not always adapted to 1/f noise investigations, and the noise indexes derived from these measurements become somewhat doubtful
More details about the measuring circuits can be found in reference r, To explain the resistor noise we assume that the film consists of chains of resistors as is shown in figure 4. rv stands for the resistance of a single bulk grain
Summary
Thin and thick film resistors show a very low curren.t noise level (10 nV/V per decade), which makes current noise hard to measure. Since the industrial equipment used normally was unsatisfactory, we developed a more sensitive circuit. This circuit allows measurement of the current noise in the frequency range 0.1 Hz to 104 Hz for resistors of [2 to. The fact that we are able to characterize current noise, makes it possible to investigate the influence of a number of parameters. The experimental results will be compared with a "grain-model" for 1/f noise
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