Abstract
The excess noise ratio n−1, defined as the excess noise intensity over the thermal noise intensity, is used as a parameter for characterizing the current noise of integrated resistors. Theoretically n−1 is proportional to the square of the device current, inversely proportional to the square of the device width, and independent of the device length. This is well verified by experiment. The noise spectrum is of the form 1 ƒ α with α practically equal to unity, as expected for flicker noise. The effect of current crowding near the current-carrying contacts is investigated.
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