Abstract
This paper presents a half-rate currentintegrating DFE receiver with sub-unit interval (sub-UI) inter-symbol interference (ISI) cancellation. By having a single additional DFE tap in each data path, the proposed DFE receiver can minimize BER degradation due to input pattern dependency and feedback tap latency problems in conventional current-integrating DFE receivers. The proposed DFE receiver was designed and fabricated in a 45 nm CMOS process, whose measurement results indicated that the BER bathtub width is increased from 0.235 UI to 0.315 UI (34% improvement) at 10 -12 BER level.
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