Abstract

The critical temperature in a superconducting ring changes periodically with the magnetic flux threading it, giving rise to the well-known Little-Parks magnetoresistance oscillations. Periodic changes of the critical current in a superconducting quantum interference device (SQUID), consisting of two Josephson junctions in a ring, lead to a different type of magnetoresistance oscillations utilized in detecting extremely small changes in magnetic fields. Here we demonstrate current-induced switching between Little-Parks and SQUID magnetoresistance oscillations in a superconducting nano-ring without Josephson junctions. Our measurements in Nb nano-rings show that as the bias current increases, the parabolic Little-Parks magnetoresistance oscillations become sinusoidal and eventually transform into oscillations typical of a SQUID. We associate this phenomenon with the flux-induced non-uniformity of the order parameter along a superconducting nano-ring, arising from the superconducting leads (‘arms’) attached to it. Current enhanced phase slip rates at the points with minimal order parameter create effective Josephson junctions in the ring, switching it into a SQUID.

Highlights

  • The critical temperature in a superconducting ring changes periodically with the magnetic flux threading it, giving rise to the well-known Little-Parks magnetoresistance oscillations

  • Our measurements in Nb nano-rings show that as the bias current increases, the parabolic Little-Parks magnetoresistance oscillations become sinusoidal and eventually transform into oscillations typical of a superconducting quantum interference device (SQUID). We associate this phenomenon with the flux-induced non-uniformity of the order parameter along a superconducting nano-ring, arising from the superconducting leads (‘arms’) attached to it

  • The present study may offer a different approach in designing a SQUID without Josephson junctions by switching a nano-ring with two arms into a SQUID using a large enough bias current

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Summary

Methods

Niobium thin films were deposited from a Nb target (99.95%, ACI Alloys) on silicon substrates with 1 μm of thermal silicon oxide via DC-magnetron sputtering. Sputtering was performed in 2 mTorr Ar pressure, at room temperature and a rate of 1.8 Å/s, to a total thickness of 40 nm. The Nb films were spin-coated with about 200 nm of Poly(methyl ethacrylate) (PMMA) 950 A4 resist (Microchem Corp.) and baked on a hot-plate at 180 °C for 120 seconds. Masks were made using Electron-Beam Lithography by overexposing the PMMA and causing the PMMA polymers to be cross-linked as described in[26,27]. The Nb was etched with Reactive Ion Etching (RIE) using SF6. The full procedure is described in[28]. Electrical contacts were made by wire bonding of 25 um thick aluminum wires directly to the Nb

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