Abstract
New formulas are given describing the current correlation signals of bulk traps and interface states in metal-oxide-semiconductor structures. The presented formulas describe the correlation signals for analog measurement systems utilizing a single-channel or a two-channel boxcar integrator. These formulas take into account both the so-called Lambda effect and an arbitrarily chosen gate width of a boxcar integrator. A comparative analysis has been made of a potential sensitivity and selectivity of these systems as a function of a gate width.
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