Cu(100) multilayer relaxation

Abstract

To investigate whether multilayer relaxation could be demonstrated to exist in a relatively simple metallic surface, existing LEED data for Cu(100) have been reanalyzed. The results from the new analysis clearly provide evidence for multilayer relaxation in Cu(100), and the first and second interlayer spacing are indicated to deviate (−1.10±0.40)% and (+1.70±0.60)%, respectively, from the bulk value. Evidence is also found to suggest that the third interlayer spacing is expanded by more than 1%. The quoted values for the deviations of the first and second interlayer spacings are mean values which resulted from analyses of data for each of 16 individual I‐V profiles, while the error limits were obtained for a 95% confidence level using a student‐t statistics test. The above values also were found to be consistent with results obtained when different multibeam ’’R‐factors’’ were used to analyze averaged experimental I‐V profiles.