Abstract
In this paper, we study the temperature change of a μ-bolometer focal plane array with a capacitive transimpedance amplifier bias cancellation circuit. Thermal analysis is essential to understand the performance of a μ-bolometer focal plane array, and to improve the temperature stability of a focal plane array characteristics. In this study, the thermal analyses of a μ-bolometer and its two reference detectors are carried out as a function of time. The analyses are done with the 30㎛ pitch 320x240 focal plane array operating of 60 ㎐ frame rate and having a columnwise readout. From the results, the temperature increase of a μ-bolometer in FPA by an incident IR is estimated as 0.689 ℃, while the temperature increase by a pulsed bias as 7.1 ℃, which is about 10 times larger than by IR. The temperature increase of a reference detector by a train of bias pulses may be increased much higher than that of an active μ-bolometer. The suppression of temperature increase in a reference bolometer can be done by increasing the thermal conductivity of the reference bolometer, in which the selection of thermal conductivity also determines the range of CTIA output voltage.
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