Abstract
Emission and excitation spectra at liquid helium and liquid nitrogen temperature of CsI(Tl) single crystals and evaporated thin layers have revealed the existence of new centers in such materials. In particular, an emission band is observed around 460nm excited near 325 nm correlates with the quality of the evaporated thin film in terms of light yield and temporal behavior. The results can be interpreted using a dopant ion-bound exciton model involving different kinds of perturbed and non-perturbed centers.
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