Abstract

T-(Al20Cu2Mn3) phase dispersoids are important for limiting recovery and controlling grain growth in Al-Cu alloys. However, these dispersoids can also reduce precipitation hardening by acting as heterogeneous nucleation sites and may lead to increased susceptibility towards pitting corrosion when galvanically coupled with S-(Al2CuMg) phase precipitates. The interplay between T- and S-phases is therefore important for understanding their effect on the mechanical and electrochemical properties of Al-Cu-Mg alloys. Here, the crystallographic relationships between the T-phase, S-phase, and surrounding Al matrix were investigated in an Al-1.31Cu-1.14Mg-0.13Ag-0.10Fe-0.28Mn (at.%) alloy by combining scanning precession electron diffraction with misorientation analysis in 3-dimensional axis-angle space and high-resolution transmission electron microscopy. Orientation relationships are identified between all three phases, revealing S-T orientation relationships for the first time. Differences in S-Al orientation relationships for precipitates formed at T-phase interfaces compared to their non-interfacial counterparts were also identified. These insights provide a comprehensive assessment of the crystallographic relationships in T-/S-phase aggregates, which may guide future alloy design.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.