Abstract
Single crystals of magnesia (MgO) and yttria-stabilized zirconia (YSZ) with (100), (110) and (111) orientations were implanted with 100 and 150keV Ar+ ions at room temperature. Rutherford backscattering spectrometry combined with ion channeling (RBS/C) was used to analyze radiation damage. Results showed that there is strong crystallographic orientation dependence for damage accumulation. In both materials, the greatest amount of damage was observed in samples with (111) orientation and the least in (110) samples. This variation in the amount of damage may be due to the dynamic annealing rate anisotropy. Such behavior of YSZ and MgO under ion bombardment confirms the damage anisotropy model describing the biaxial texture development in these materials during ion beam assisted deposition (IBAD).
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
