Abstract
Crystallites of CdTe were studied by HREM (JEM 4000EX), image processing and contrast simulations. CdTe island films were prepared by vapour deposition on cleavage faces of NaCl crystals. For crystallites in (111) orientation, Fourier analysis of the micrographs revealed a sixfold symmetry of reflections in two ring systems. On the assumption of the cubic modification of CdTe (sphalerite structure), complete cells of the (111) Laue zone axis provide only the (220) fringe system over the range of resolution considered. The alternative crystallographic description of CdTe (wurzite structure) yielded simulated contrast tables (thickness/defocus maps) that allow one to interpret the experimental results unambiguously. Calculated reflection intensity/thickness profiles of alternative crystallographic models exclude everything except the -AB- stacking as significant in the CdTe microcrystals.
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