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Abstract
The mechanism of the increased crystallization stability (the difference between glass incipient crystallization temperature and transition temperature) of Sb2O3 —doped vanadium phosphate sealing glass investigated by X-ray photoelectron spectroscopy (XPS) is reported in the present study. Experimental results showed that after doping with Sb2O3, the rate of bridging oxygen increased while the rate of no-bridging oxygen decreased, and the ratio of V4+/Vtotal also increased, too. This two changes led to the break of V=0 bond which is essential for the formation of V2O5 crystalline phase, thus inhibited the formation of that crystalline phase and improved glass crystallization stability.
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