Abstract
Semi crystalline and amorphous PEEK were drawn at 154 and 149°C, respectively, using the solid-state extrusion technique. The crystal orientation and total orientation of drawn PEEK were determined. The relationships between deformation history and crystallization have been investigated. Previously drawn PEEK was crystallized nonisothermally and isothermally from the melt. Results show that the crystallization of drawn PEEK is slower than that of the undrawn initial films. An orientation-induced crystallization was found during the solid-state extrusion of amorphous PEEK films at 149°C
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