Abstract
The kinetics of crystallization of Fe 80Si xB 20 − x (with x = 2, 4, 6, 8, 10) and Fe 75Si 15B 10 glassy ribbons was examined using differential scanning calorimetry and high precision electrical resistivity measurements. The main crystallization parameters are presented. The corresponding structure of the materials was observed using transmission electron microscopy (TEM) and X-ray diffraction (XRD) analysis. The mechanism of crystallization is described in terms of the local ordering (cluster) model.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
