Abstract
ABSTRACTTemperature dependency of crystalline lamellar thickness during crystallization and subsequent melting in isotactic polypropylene crystallized from both quiescent molten state and stress‐induced localized melt was investigated using small angle X‐ray scattering technique. Both cases yield well‐defined crystallization lines where inverse lamellar thickness is linearly dependent on crystallization temperature with the stretching‐induced crystallization line shifted slightly to smaller thickness direction than the isothermal crystallization one indicating both crystallization processes being mediated a mesomorphic phase. However, crystallites obtained via different routes (quiescent melt or stress‐induced localized melt) show different melting behaviors. The one from isothermal crystallization melted directly without significant changing in lamellar thickness yielding well‐defined melting line whereas stress‐induced crystallites followed a recrystallization line. Such results can be associated with the different extent of stabilization of crystallites obtained through different crystallization routes. © 2017 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2017, 55, 957–963
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Polymer Science Part B: Polymer Physics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
